SPEAKERS

 

Keynote Speakers

 

 

Prof. Victor A. Soifer
Samara University, Russia

Bio-sketch:  Academician of RAS Victor Soifer, Dr.Sc. (1979), PhD (1971), President of Samara National Research University, the chief researcher of the IPSI RAS –Branch of the FSRC “Crystallography and Photonics” RAS and the Editor-in-Chief of Computer Optics. He is a SPIE-and IAPR-member. He is the author and coauthor of more than 700 scientific publications, 10 books, and 50 author’s certificates and patents. General research areas: diffractive optics and nanophotonics, image analysis, pattern recognition, computer vision, and artificial intelligence.
Web of Science: https://www.webofscience.com/wos/author/record/C-3088-2017
Scopus ID: https://www.scopus.com/authid/detail.uri?authorId=36836834300
ORCID: https://orcid.org/0000-0003-4239-4389
 

Prof. Ehrenfried Zschech
DeepXscan GmbH, Germany

Bio-sketch:  Ehrenfried Zschech is CTO and Co-Founder of deepXscan GmbH, Dresden, Germany. His responsibilities include R&D in the field of high-resolution X-ray imaging and the development of customized solutions for a broad range of applications. Ehrenfried Zschech received his Dr. rer. nat. degree from Dresden University of Technology. After having spent four years as a project leader in the field of metal physics and reliability of microelectronic interconnects at Research Institute for Nonferrous Metals in Freiberg, he was appointed as a university teacher for ceramic materials at Freiberg University of Technology. In 1992, he joined the development department at Airbus in Bremen, where he managed the metal physics group and studied the laser-welding metallurgy of aluminum alloys. From 1997 to 2009, Ehrenfried Zschech managed the Materials Analysis Department and the Center for Complex Analysis at Advanced Micro Devices in Dresden. In this position, he was responsible for the analytical support for process control and technology development in leading-edge semiconductor manufacturing, as well as for physical failure analysis. Ehrenfried Zschech was Department Head at the Fraunhofer Institutes IZFP and IKTS and Head of the Steering Committee of the Dresden Fraunhofer Cluster Nanoanalysis from 2009 to 2021. His responsibilities included multi-scale materials characterization and reliability engineering. Ehrenfried Zschech holds an adjunct professorship at Faculty of Chemistry of Warsaw University as well as honorary professorships for Nanomaterials at Brandenburg University of Technology Cottbus-Senftenberg and for Nanoanalysis at Dresden University of Technology. Ehrenfried Zschech is Member of the European Academy of Science (EurASc) and Member of the of the German National Academy of Science and Engineering (ACATECH). In 2019, he was awarded with the FEMS European Materials Gold Medal.

Invite Speaker

 

Dr. Flavio Piccoli
University of Milano, Italy

Bio-sketch: Flavio Piccoli is an Assistant Professor of Computer Science in the Department of Excellence in Informatics, Systems and Communication at the University of Milano-Bicocca. He is also an associate member of the Imaging and Vision Lab (IVL), directed by Prof. Raimondo Schettini.

From 2019 to 2023 he was a postdoctoral research fellow at the Italian National Institute of Nuclear Physics (INFN) and the University of Milano-Bicocca. In 2019, he received the degree of Doctor of Philosophy degree (PhD) in Computer Science with a thesis focused on automatic quality inspection. In 2014, he received his master's degree in Computer Science with a thesis focused on face analysis methods. He spent a period abroad at the Computer Vision Center (CVC) laboratory of the Universitat Autònoma de Barcelona (UAB), in the Learning and Machine Perception (LAMP) research group directed by Prof. Joost van de Weijer.

His main research interests are in the field of artificial intelligence, machine and deep learning, computer vision, image enhancement, remote sensing, and automatic quality inspection.

He has authored several scientific papers in indexed and high Scopus-scoring journals and conferences. He is an associate editor of the SPIE Journal of Electronic Imaging and Frontiers in Artificial Intelligence. He is currently teaching the course "Advanced Computational Techniques for Big Imaging and Signal Data" for the innovative inter-university master's degree course in Artificial Intelligence for Science and Technology, jointly organized by the University of Milan, the University of Pavia and the University of Milano-Bicocca.
 

 

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