SPEAKERS

 

Keynote Speakers

 

 

Pietro Ferraro
SPIE Fellow, H-index: 64
Institute of Applied Sciences & Intelligent Systems Campi Flegrei, Italy

Title:  Learning strategies for the recognition and classification of micro-objects through holographic footprints

Bio-sketch:  Dr. Pietro Ferraro received the doctor of Physics degree, summa cum laude, from the University of Napoli “Federico II”, Italy, in 1987.
Soon after he joined Aeritalia-Alenia Aeronautics (the major Aerospace company in Italy) as researcher to develop applied research in Optical Non-Destructive Testing of carbon fiber materials. He has been Principal Investigator (PI) (1991-1993) on behalf of Composite Materials Research Center of Alenia for two R&D Projects in the frame of a Cooperative Research And Development Agreement (CRADA) between Finmeccanica (Roma) and United Technologies Research Center, Electronics & Photonics Group (Directed by Dr. A.J. De Maria), East Hartford, CT (USA).
The two research projects were on “Non destructive testing of large composite aircraft structures by Holography methods” (PI for UTRC Dr. Karl A. Stetson) and “Fiber Optic Bragg Grating Sensors” (PI for UTRC Dr. J. R. Dunphy). During this cooperation he contributed to pioneering work on Fiber Bragg Grating for strain sensing, development of related instrumentations and optical fiber emebedding process in composite materials for which 3 patents were awarded jointly to Finmeccanica and UTRC. In 1993 he joined Consiglio Nazionale delle Ricerche (CNR) Optics Group at Institute of Cybernetics, Pozzuoli (Napoli), Italy as Associate Researcher to develop interferometric and holographic methods for testing and characterization of optical components and materials. In 2001 he joined as Researcher the CNR–Institute of Microelectronics and Microsystems, Napoli. In 2003 he joined National Institute for Applied Optics (INOA) as Senior Research Scientist. Since 2005 he is Head of the Research Line and Group on behalf of CNR in Optical diagnostics, Interferometric and Microscopy. (More)

Vittorio Murino
Director of the Pattern Analysis & Computer Vision (PAVIS), IAPR Fellow, H-index: 56
Italian Institute of Technology (IIT), Italy

Bio-sketch:  Vittorio Murino is full professor at the University of Verona, Italy, and Senior Video Intelligence Expert at the Ireland Research Centre of Huawei Technologies (Ireland) Co., Ltd. in Dublin. He took the Laurea degree in Electronic Engineering in 1989 and the Ph.D. in Electronic Engineering and Computer Science in 1993 at the University of Genova, Italy. He was chairman of the Department of Computer Science from 2001, year of foundation, to 2007, and director of PAVIS (Pattern Analysis and Computer Vision) department at Istituto Italiano di Tecnologia in Genova, Italy, from 2009 to 2019.
His main research interests include computer vision and machine learning, more specifically, statistical, probabilistic and deep learning techniques for image and video processing for (human) behavior analysis and related applications such as video surveillance and biomedical imaging.
Prof. Murino is co-author of more than 400 papers published in refereed journals and international conferences, member of the technical committees of important conferences (CVPR, ICCV, ECCV, ICPR, ICIP, etc.), and guest co-editor of special issues in relevant scientific journals. He is also member of the editorial board of Computer Vision and Image Understanding and Machine Vision & Applications journals. Finally, prof. Murino is IEEE Senior Member and IAPR Fellow.

Rolf-Jürgen Ahlers
ProxiVision GmbH, Germany

Bio-sketch:  coming soon......

Invite Speakers

Konstantin Bulatov
Federal Research Center "Computer Science and Control" of RAS, Russia

Bio-sketch:  Konstantin Bulatov was born in Petrozavodsk, Russian Federation in 1991. He received a Specialist degree in applied mathematics from the National University of Science and Technology “MISiS”, Moscow, Russia, in 2013. He obtained his Ph.D. degree in computer science in 2020 from the Federal Research Center “Computer Science and Control” of Russian Academy of Sciences, Moscow, Russia.

Since 2014 he is employed at the Federal Research Center “Computer Science and Control” of Russian Academy of Sciences, Moscow, Russia, and since 2016 he is employed at Smart Engines Service LLC, Moscow, Russia. He has been teaching a “Combinatorial optimization” course at the Moscow Institute of Physics and Technology (State University). His fields of study are computer vision, image processing, and document recognition systems.

 Johan Debayle
Ecole Nationale Supérieure des Mines, Saint-Etienne, France

Bio-sketch:  he received his M.Sc., Ph.D. and Habilitation degrees in the field of image processing and analysis, in 2002, 2005 and 2012 respectively. Currently, he is a Full Professor at the Ecole Nationale Supérieure des Mines de Saint-Etienne (ENSM-SE) in France, within the SPIN Center and the LGF Laboratory, UMR CNRS 5307, where he leads the PMDM Department interested in image analysis of granular media. In 2015, he was a Visiting Researcher for 3 months at the ITWM Fraunhofer / University of Kaisersleutern in Germany. In 2017 and 2019, he was invited as Guest Lecturer at the University Gadjah Mada, Yogyakarta, Indonesia. He was also Invited Professor at the University of Puebla in Mexico in 2018 and 2019. He is the Head of the Master of Science in Mathematical Imaging and Spatial Pattern Analysis (MISPA) at the ENSM-SE.
His research interests include image processing and analysis, pattern recognition and stochastic geometry. He published more than 120 international papers in international journals and conference proceedings and served as Program committee member in several international conferences (IEEE ICIP, MICCAI, ICIAR…). He has been invited to give a keynote talk in several international conferences (SPIE ICMV, IEEE ISIVC, SPIE-IS&T EI, SPIE DCS…)
He is Associate Editor for 3 international journals: Pattern Analysis and Applications (Springer), Journal of Electronic Imaging (SPIE) and Image Analysis and Stereology (ISSIA).
He is a member of the International Society for Optics and Photonics (SPIE), International Association for Pattern Recognition (IAPR), International Society for Stereology and Image Analysis (ISSIA) and Senior Member of the Institute of Electrical and Electronics Engineers (IEEE).

 

 

 

 

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